dc.contributor.author |
Yeap, Yew Ming |
en |
dc.contributor.author |
Geddada, Nagesh |
en |
dc.contributor.author |
Satpathi, Kuntal |
en |
dc.contributor.author |
Ukil, Abhisek |
en |
dc.date.accessioned |
2018-10-16T23:16:13Z |
en |
dc.date.issued |
2018 |
en |
dc.identifier.citation |
IEEE Transactions on Industrial Informatics 14:10 4353-4364 2018 |
en |
dc.identifier.issn |
1551-3203 |
en |
dc.identifier.uri |
http://hdl.handle.net/2292/42220 |
en |
dc.relation.ispartofseries |
IEEE Transactions on Industrial Informatics |
en |
dc.rights |
Items in ResearchSpace are protected by copyright, with all rights reserved, unless otherwise indicated. Previously published items are made available in accordance with the copyright policy of the publisher. |
en |
dc.rights.uri |
https://researchspace.auckland.ac.nz/docs/uoa-docs/rights.htm |
en |
dc.rights.uri |
https://www.ieee.org/publications/rights/author-posting-policy.html |
en |
dc.title |
Time and Frequency Domain Fault Detection in VSC Interfaced Experimental DC Test System |
en |
dc.type |
Journal Article |
en |
dc.identifier.doi |
10.1109/TII.2018.2796068 |
en |
pubs.begin-page |
1 |
en |
dc.rights.holder |
Copyright: IEEE |
en |
pubs.end-page |
1 |
en |
pubs.publication-status |
Published |
en |
dc.rights.accessrights |
http://purl.org/eprint/accessRights/OpenAccess |
en |
pubs.elements-id |
723421 |
en |
pubs.org-id |
Engineering |
en |
pubs.org-id |
Department of Electrical, Computer and Software Engineering |
en |
dc.identifier.eissn |
1941-0050 |
en |