Time and Frequency Domain Fault Detection in VSC Interfaced Experimental DC Test System

Yeap, Yew Ming; Geddada, Nagesh; Satpathi, Kuntal; Ukil, Abhisek

dc.contributor.author	Yeap, Yew Ming	en
dc.contributor.author	Geddada, Nagesh	en
dc.contributor.author	Satpathi, Kuntal	en
dc.contributor.author	Ukil, Abhisek	en
dc.date.accessioned	2018-10-16T23:16:13Z	en
dc.date.issued	2018	en
dc.identifier.citation	IEEE Transactions on Industrial Informatics 14:10 4353-4364 2018	en
dc.identifier.issn	1551-3203	en
dc.identifier.uri	http://hdl.handle.net/2292/42220	en
dc.relation.ispartofseries	IEEE Transactions on Industrial Informatics	en
dc.rights	Items in ResearchSpace are protected by copyright, with all rights reserved, unless otherwise indicated. Previously published items are made available in accordance with the copyright policy of the publisher.	en
dc.rights.uri	https://researchspace.auckland.ac.nz/docs/uoa-docs/rights.htm	en
dc.rights.uri	https://www.ieee.org/publications/rights/author-posting-policy.html	en
dc.title	Time and Frequency Domain Fault Detection in VSC Interfaced Experimental DC Test System	en
dc.type	Journal Article	en
dc.identifier.doi	10.1109/TII.2018.2796068	en
pubs.begin-page	1	en
dc.rights.holder	Copyright: IEEE	en
pubs.end-page	1	en
pubs.publication-status	Published	en
dc.rights.accessrights	http://purl.org/eprint/accessRights/OpenAccess	en
pubs.elements-id	723421	en
pubs.org-id	Engineering	en
pubs.org-id	Department of Electrical, Computer and Software Engineering	en
dc.identifier.eissn	1941-0050	en