Time and Frequency Domain Fault Detection in VSC Interfaced Experimental DC Test System

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dc.contributor.author Yeap, Yew Ming en
dc.contributor.author Geddada, Nagesh en
dc.contributor.author Satpathi, Kuntal en
dc.contributor.author Ukil, Abhisek en
dc.date.accessioned 2018-10-16T23:16:13Z en
dc.date.issued 2018 en
dc.identifier.citation IEEE Transactions on Industrial Informatics 14:10 4353-4364 2018 en
dc.identifier.issn 1551-3203 en
dc.identifier.uri http://hdl.handle.net/2292/42220 en
dc.relation.ispartofseries IEEE Transactions on Industrial Informatics en
dc.rights Items in ResearchSpace are protected by copyright, with all rights reserved, unless otherwise indicated. Previously published items are made available in accordance with the copyright policy of the publisher. en
dc.rights.uri https://researchspace.auckland.ac.nz/docs/uoa-docs/rights.htm en
dc.rights.uri https://www.ieee.org/publications/rights/author-posting-policy.html en
dc.title Time and Frequency Domain Fault Detection in VSC Interfaced Experimental DC Test System en
dc.type Journal Article en
dc.identifier.doi 10.1109/TII.2018.2796068 en
pubs.begin-page 1 en
dc.rights.holder Copyright: IEEE en
pubs.end-page 1 en
pubs.publication-status Published en
dc.rights.accessrights http://purl.org/eprint/accessRights/OpenAccess en
pubs.elements-id 723421 en
pubs.org-id Engineering en
pubs.org-id Department of Electrical, Computer and Software Engineering en
dc.identifier.eissn 1941-0050 en


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