Identification of power quality events: selection of optimum base wavelet and machine learning algorithm
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Identification of power quality events: selection of optimum base wavelet and machine learning algorithm
Hafiz, Faizal
;
Swain, Akshya
;
Naik, C
;
Abecrombie, S
;
Eaton, A
Identifier:
http://hdl.handle.net/2292/45536
Issue Date:
2019-03-01
Reference:
IET SCIENCE MEASUREMENT & TECHNOLOGY 13(2):260-271 01 Mar 2019
Rights:
Copyright: Institution of Engineering and Technology
Rights (URI):
https://researchspace.auckland.ac.nz/docs/uoa-docs/rights.htm
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DOI:
10.1049/iet-smt.2018.5044
This item appears in the following Collection(s)
Journal Articles
[23290]
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