Abstract:
In this paper we show that two important generalized metric properties are generalizations of first countability. We give some conditions on these generalized metric properties which imply metrizability. We prove that, a space $X$ is metrizable if and only if $X$ is a strongly quasi-N-space, quasi$-gamma-$space; a quasi$-gamma$ space is metrizable if and only if it is a pseudo $wN-$ space or quasi$-$Nagata$-$space with quasi $G^*_gamma-$diagonal; a space $X$ is a metrizable space if and only if $X$ has a $CWBC-$map $g$ satisfying the following conditions: 1. $g$ is a pseudo-strongly-quasi-N-map; 2. for any $A subseteq X, overline{A} subseteq cup {g(n, x) : x in A}$.