Surface Profilometry of Curved Optics Using a Shack-Hartmann Sensor

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dc.contributor.author Amani, Reza en
dc.contributor.author Tang, S en
dc.contributor.author Abbas, N en
dc.contributor.author Aguergaray, Claude en
dc.contributor.author Broderick, N en
dc.coverage.spatial Yokohama, Japan en
dc.date.accessioned 2020-06-11T22:45:13Z en
dc.date.issued 2020-04 en
dc.identifier.uri http://hdl.handle.net/2292/51491 en
dc.description.abstract We report surface profilometry of curved optics against a flat optical reference within a deformation of ~120 nm and repeatability of RMS 2.3 nm using a 150 μm-spatial-resolution Shack-Hartmann wavefront sensor. en
dc.description.uri https://opicon.jp/ en
dc.relation.ispartof The 9th Advanced Lasers and Photon Sources (ALPS2020) en
dc.rights Items in ResearchSpace are protected by copyright, with all rights reserved, unless otherwise indicated. Previously published items are made available in accordance with the copyright policy of the publisher. en
dc.rights.uri https://researchspace.auckland.ac.nz/docs/uoa-docs/rights.htm en
dc.title Surface Profilometry of Curved Optics Using a Shack-Hartmann Sensor en
dc.type Conference Item en
dc.rights.holder Copyright: The author en
pubs.author-url https://opicon.jp/conferences/alps en
pubs.finish-date 2020-04-23 en
pubs.start-date 2020-04-20 en
dc.rights.accessrights http://purl.org/eprint/accessRights/RestrictedAccess en
pubs.subtype Conference Paper en
pubs.elements-id 798196 en
pubs.org-id Science en
pubs.org-id Physics en
pubs.record-created-at-source-date 2020-04-20 en
pubs.online-publication-date 2020-04-20 en


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