dc.contributor.author |
Chen, HT |
en |
dc.contributor.author |
Hu, Aiguo |
en |
dc.contributor.author |
Budgett, David |
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dc.coverage.spatial |
Harbin, China |
en |
dc.date.accessioned |
2011-11-03T02:36:05Z |
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dc.date.issued |
2007 |
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dc.identifier.citation |
2nd IEEE Conference on Industrial Electronics and Applications (ICIEA 2007), Harbin, China, 25 May 2007 - 27 May 2007. Proc of 2nd IEEE Conference on Industrial Electronics and Applications (ICIEA 2007). IEEE. 2007 |
en |
dc.identifier.isbn |
978-1-4244-0736-1 |
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dc.identifier.uri |
http://hdl.handle.net/2292/8598 |
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dc.description.abstract |
Efficiency of a transcutaneous energy transfer (TET) system is very important when delivering a substantial amount of power both in terms of heat generation and battery capacity for portable operation. Accurate analysis of the efficiency of different sub-systems within a TET system is important to identify the areas where significant improvements are most likely. A general approach to characterizing and quantifying power losses is presented. The methods are used to identify power loss components in a TET system capable of providing 10W of power under loose coupling conditions. It has been found the greatest potential for efficiency improvements for this system is associated with power conditioning stage, primary resonant inductor and base/gate drive circuits. |
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dc.publisher |
IEEE |
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dc.relation.ispartof |
2nd IEEE Conference on Industrial Electronics and Applications (ICIEA 2007) |
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dc.relation.ispartofseries |
Proc of 2nd IEEE Conference on Industrial Electronics and Applications (ICIEA 2007) |
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dc.rights |
Items in ResearchSpace are protected by copyright, with all rights reserved, unless otherwise indicated. Previously published items are made available in accordance with the copyright policy of the publisher. |
en |
dc.rights.uri |
https://researchspace.auckland.ac.nz/docs/uoa-docs/rights.htm |
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dc.subject |
HEART |
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dc.title |
Power Loss Analysis of a TET System for High Power Implantable Devices |
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dc.type |
Conference Item |
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dc.identifier.doi |
10.1109/ICIEA.2007.4318407 |
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pubs.begin-page |
240 |
en |
dc.rights.holder |
Copyright: IEEE |
en |
pubs.end-page |
245 |
en |
pubs.finish-date |
2007-05-27 |
en |
pubs.start-date |
2007-05-25 |
en |
dc.rights.accessrights |
http://purl.org/eprint/accessRights/RestrictedAccess |
en |
pubs.subtype |
Proceedings |
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pubs.elements-id |
77083 |
en |
pubs.org-id |
Bioengineering Institute |
en |
pubs.org-id |
ABI Associates |
en |
pubs.org-id |
Engineering |
en |
pubs.org-id |
Department of Electrical, Computer and Software Engineering |
en |
pubs.record-created-at-source-date |
2010-09-01 |
en |